The 4-Jaw slit system can be used for ion beam diagnostics for the purpose of collimating or blanking the charged particle beam. Each slit is mounted on a linear feedthrough in order to be individually moved into and out of the beam.

The low lower system is designed for collimating beams of charged particles with an energy of 3 MeV and a beam power up to 6 W beam power in broad pressure ranges, down to ultra-high vacuum conditions.

  • 4 mm thick slit aperture made of copper
  • Each slit is mounted to a motorized linear feedthrough
    thus being individually adjustable
  • Travel length 40mm in steps of 0.71 μm
  • BNC feedthrough for charged particle current readout on
    the individual aperture
  • Vacuum chamber with DN63 ISO-F beamline connection
    flanges