Product details
Product number
932-S7-09-00001
Flange
CF63
Resolution
0.71 μm
Travel Length
40 mm
The 4-Jaw slit system can be used for ion beam diagnostics for the purpose of collimating or blanking the charged particle beam. Each slit is mounted on a linear feedthrough in order to be individually moved into and out of the beam.
The low lower system is designed for collimating beams of charged particles with an energy of 3 MeV and a beam power up to 6 W beam power in broad pressure ranges, down to ultra-high vacuum conditions.

Special features
Documents
- 4 mm thick slit aperture made of copper
- Each slit is mounted to a motorized linear feedthrough
thus being individually adjustable - Travel length 40mm in steps of 0.71 μm
- BNC feedthrough for charged particle current readout on
the individual aperture - Vacuum chamber with DN63 ISO-F beamline connection
flanges